Scatter correction for computed tomography imaging

ABSTRACT

Systems and methods for scatter correction of x-ray images are provided. A scatter image of an object can be corrected using partial-scatter free images acquired using an aperture plate. The plate is positioned between an object and a radiation detector and includes apertures in a grid. The original x-rays pass through the apertures and scattered x-rays can be blocked by the aperture plate. The aperture plate can be moved to different positions, allowing partial scatter-free images to be acquired at each position of the aperture plate. A full scatter-free image can be generated by combining partial scatter-free images. The scatter and scatter-free images can be further used to train scatter correction models.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application claims the benefit of U.S. Provisional PatentApplication No. 63/090,144, filed on Oct. 9, 2020, and entitled “ScatterCorrection For Computed Tomography Imaging,” the entirety of which isincorporated by reference.

BACKGROUND

Inspection of objects is commonly performed in manufacturing and repairindustries. Various types of inspection systems can be used inindustrial inspection processes, such as computed tomography (CT),coordinate measuring machines (CMM), laser-based profilometry, lightgauge, infrared and others. For example, these inspection systems can beused to measure dimensions or to identify defects in manufactured parts(e.g., turbine blades).

Each of these inspection systems has its advantages and disadvantages.Modalities such as CMM and laser-based profilometry can be used tomeasure external surfaces with high accuracy but they cannot measureinternal features unless the object is cut open. To date, CT is the mostversatile of the measurement/inspection systems for revealing both theinternal and external structures of industrial parts in anon-destructive manner. Because of their ability to provide internal aswell as external measurements, CT based techniques may facilitateprocesses such as reverse engineering, rapid prototyping, castingsimulation and validation, tire development, first article inspection,ceramic porosity inspection, process validation, parts qualification anddefect detection, among others.

SUMMARY

However, CT based techniques may also have certain limitations, whichmay deter their widespread use. For example, volumetric computerizedtomography (VCT) imaging for industrial applications (e.g., imaging ofmetallic parts) can provide unsatisfactory images having image artifactsdue to radiation-matter interaction based artifacts, scanner basedartifacts, reconstruction techniques based artifacts, and so forth. Theradiation-matter interaction based artifacts may further include beamhardening artifacts and artifacts due to x-ray scatter radiations.Scatter radiation is a strong function of the imaging parameters such asthe object under imaging, beam spectrum used, geometrical distances, andthe surrounding medium. In general, scatter radiation in the projectionimages can be undesirable, as it can reduce the contrast of theprojection images, produce degradation of or blurs sharp features of theobject in the generated volume images, and reduce the accuracy ofmetrology applications and the detectability of smaller features.

Accordingly, various techniques have been developed to estimate scatterin order to reduce or eliminate it from CT images. In general, due tovarious dependencies in the imaging parameters, an accurate estimationof the scatter signal content in projection imaging can be challenging.Physics-based models are often used for predicting scatter content inx-ray images, however they are time consuming and predict only scatterarising out of the object under scanning, provided the materialproperties are known.

There exist different techniques for scatter measurement and scattercorrection in acquired projection images. For example, one popularscatter measurement technique employs a beam stopper located between theradiation source and the object being scanned in a VCT system to measurethe scatter at a corresponding location. However, most currently knowntechniques primarily address the object scatter and involvetime-consuming computer simulations.

As manufacturing tolerances become tighter, there is a correspondingincrease in the demands for metrology techniques for maintaining thetolerances. The need for quality and performance testing has become anintegral part of the production or manufacturing process. Thus, in orderto improve CT inspection accuracy and efficiency, more effective methodsare needed for removing scatter radiation related artifacts.

Embodiments of the present disclosure provide improved systems andmethods for scatter correction. A scatter image of an object can becorrected using additional images acquired with a scatter rejectingaperture plate. The scatter rejecting aperture plate can include aplurality of apertures positioned on a grid. In use, the aperture plateis positioned between an object being imaged and a detector. Whencollimated x-rays are directed from an x-ray source to the object, theoriginal x-rays can pass through the apertures, while a significantfraction of scattered x-rays can be blocked by the aperture plate. Theaperture plate can also be configured to move between differentpositions. Thus, partial scatter-free images can be acquired at eachposition of the aperture plate, referred to herein as partialscatter-free images. A scatter-free image (ground truth) can be obtainedby combining the partial scatter-free images. The number of positionsand acquired partial scatter-free images can be varied, depending on thegeometry of the aperture plate. In general, the number of positions canbe sufficient such that the apertures cover the entire area of scatteredimage which is to be scatter corrected.

The above-discussed embodiment relies upon the use of an aperture platehaving discrete holes, also referred to as a beam hole, to acquirepartial scatter-free images. In alternative embodiments, slitcollimators or beam stops can be employed in lieu of the aperture plateto acquire partial scatter free images. Similar to the aperture plateapproach, the slit collimator or beam stop can be positioned between theradiation source and the detector and moved. Each partial scatter-freeimage can be acquired at a different position of the slit collimator orbeam stop and the partial scatter-free images can be combined to formthe scatter-free image.

The scatter-free image acquired by use of any of the aperture plate,slit collimator, or beam stops, can be further used to facilitatescatter correction. In one aspect, the scatter-free image can be used asa reference for training a neural network to determine an algorithm forscatter correction. In another aspect, the scatter-free image can beused to determine the point spread function (PSF) for a scatterdeconvolution algorithm.

In further embodiments, partial scatter free images or scatter-freeimages can be used to adjust an already trained neural network or toadjust parameters for a known PSF for convolutional-based scattercorrection.

In an embodiment, a method for scatter correction of an image of anobject is provided. The method can include acquiring, by a radiationdetector of an imaging system, data representing at least one scatterimage of an object based upon detection of radiation that is transmittedthrough an imaging volume of the object. The method can further includeplacing an aperture plate between the object and the radiation detectorat a first position. The aperture plate can include a plurality ofapertures configured to inhibit scattered radiation from detection bythe radiation detector. The method can also include acquiring, by theradiation detector, data representing at least one first partialscatter-free image based upon detection of radiation that is transmittedthrough the imaging volume of the object when the aperture plate is inthe first position. The method can additionally include moving theaperture plate to one or more second positions, different from the firstposition. The apertures of the first position and one or more secondpositions can cover the area of the object captured within the at leastone scattered image. The method can also include acquiring, by theradiation detector, data representing at least one second partialscatter-free image based upon detection of radiation that is transmittedthrough the imaging volume of the object when the aperture plate is inthe one or more second positions. The method can further includereceiving, by an analyzer including one or more processors, the at leastone first and second partial scatter-free image data. The method canadditionally include generating, by the analyzer, at least onescatter-free image based upon a combination of at least a portion of theat least one first partial scatter-free image data and at least aportion of the at least one second partial scatter-free image data. Themethod can also include updating, by the analyzer, a scatter correctionmodel using at least a portion of the at least one scatter image and theat least one scatter-free image. The method can further includeoutputting, by the analyzer, the updated scatter correction model.

In another embodiment, the scatter correction model can be a neuralnetwork model including a scatter correction algorithm. The method canfurther include operations performed by the analyzer including updatingthe scatter correction model by operations including applying thescatter correction algorithm to at least a portion of the at least onescatter image to generate a scatter-corrected image, determining adeviation between the generated scatter-corrected image and the at leastone scatter-free image. The operations can additionally include, whenthe deviation is greater than a predetermined deviation, updating thescatter correction algorithm to reduce the deviation. The operations canfurther include, when the deviation is less than or equal to thepredetermined deviation, outputting the updated scatter correction modelincluding the updated scatter correction algorithm.

In another embodiment, the scatter correction model can be adeconvolution including a scatter edge spread function (ESF). Thescatter edge spread function can further include a point spread function(PSF) configured to correct scatter within a scatter image. The methodcan further include updating the scatter correction model. The scattercorrection model can be updated by operations including applying the PSFto at least a portion of the at least one scatter image to generate ascatter-corrected image and determining a deviation between thescatter-corrected image and the at least one scatter-free image. Theoperations can further include, when the deviation is above apredetermined deviation, updating parameters of the PSF to reduce thedeviation and repeating said applying and determining operations. Theoperations can additionally include, when the deviation is below thepredetermined deviation, outputting the updated scatter correction modelincluding the updated PSF parameters.

In another embodiment, the detected radiation can be collimated.

In another embodiment, the at least one scatter free image is notgenerated by interpolation of the at least one first partialscatter-free image data or the at least one second partial scatter-freeimage data.

In another embodiment, moving the aperture plate can include at leastone of a unidirectional translation, a bidirectional translation, or arotation.

In another embodiment, the at least one scatter image can be a scatterimage set including a plurality of images.

In another embodiment, the apertures can be arranged in atwo-dimensional grid.

In another embodiment, the apertures in the first position and at theleast one second position can overlap one another.

In another embodiment, the apertures in the first position and the atleast one second position can be spaced apart by a predetermineddistance from one another.

In an embodiment, an imaging system is provided. The imaging system caninclude a radiation source, a moveable aperture plate, and an analyzer.The radiation source can be configured to emit radiation directedtowards an object. The radiation detector can be configured to detectthe emitted radiation transmitted through an imaging volume of theobject. The moveable aperture plate can be positioned between the objectand the radiation detector and it can further include a plurality ofapertures configured to inhibit scattered radiation from detection bythe radiation detector. The analyzer can include one or more processors.The analyzer can be further configured receive data representing atleast one scatter image of the object based upon detection of radiationtransmitted through an imaging volume of the object. The analyzer canalso be configured to receive data representing at least one firstpartial scatter-free image of the object based upon detection ofradiation that is transmitted through the imaging volume of the objectwhen the aperture plate is in a first position. The analyzer can beadditionally configured to receive data representing at least one secondpartial scatter-free image based upon detection of radiation that istransmitted through the imaging volume of the object when the apertureplate is in one or more second positions, different from the firstposition. The apertures in the first position and the one or more secondpositions can cover the area of the object captured within the at leastone scattered image. The analyzer can also be configured to generate atleast one scatter-free image based upon a combination of at least aportion of the at least one first partial scatter-free image data and atleast a portion of the at least one second partial scatter-free imagedata. The analyzer can be further configured to train a scattercorrection model using at least a portion of the at least one scatterimage and the at least one scatter-free image. The analyzer can beadditionally configured to output the trained scatter correction model.

In another embodiment, the scatter correction model can be a neuralnetwork model including a scatter correction algorithm. The analyzer canbe further configured to train the scatter correction algorithm byapplying the scatter correction algorithm to at least a portion of theat least one scatter image to generate a scatter-corrected image anddetermining a deviation between the generated scatter-corrected imageand the at least one scatter-free image. When the deviation is greaterthan a predetermined deviation, the analyzer can further update thescatter correction algorithm to reduce the deviation. When the deviationis less than or equal to the predetermined deviation, the analyzer canfurther output the updated scatter correction algorithm.

In another embodiment, the scatter correction model can be adeconvolution including a scatter edge spread function (ESF). Thescatter edge spread function can further include a point spread function(PSF) configured to correct scatter within a scatter image. The analyzercan be further configured to train the PSF by applying the PSF to atleast a portion of the at least one scatter image to generate ascatter-corrected image and determining a deviation between thescatter-corrected image and the at least one scatter-free image. Whenthe deviation is above a predetermined deviation, the analyzer canfurther update the parameters of the PSF to reduce the deviation andrepeating said applying and determining operations. When the deviationis below the predetermined deviation, the analyzer can output the PSFparameters.

In another embodiment, the system can further include a collimatorconfigured to collimate the emitted radiation.

In another embodiment, the analyzer is not configured to generate the atleast one scatter free image by interpolation of the at least one firstpartial scatter-free image data or the at least one second partialscatter-free image data.

In another embodiment, the first and at least one second positions candiffer by at least one of a unidirectional translation, a bidirectionaltranslation, or a rotation.

In another embodiment, the at least one scatter image can be a scatterimage set including a plurality of images.

In another embodiment, the apertures can be are arranged in atwo-dimensional grid.

In another embodiment, the apertures in the first position of theaperture plate and at the least one second position of the apertureplate can overlap one another.

In another embodiment, the apertures in the first position of theaperture plate and the at least one second position of the apertureplate can be are spaced apart by a predetermined distance from oneanother.

In an embodiment, a method for scatter correction of an image of anobject is provided. The method can include acquiring, by a radiationdetector of an imaging system, data representing a plurality of scatterimages of an object based upon detection of radiation that istransmitted through an imaging volume of the object. The method can alsoinclude placing an aperture plate between the object and the radiationdetector. The aperture plate can include a plurality of aperturesconfigured to inhibit scattered radiation from detection by theradiation detector. The method can further include acquiring, by theradiation detector, data representing a partial scatter-free imagecorresponding to each scatter image. Each partial scatter-free image canbe based upon detection of radiation that is transmitted through theimaging volume of the object when the aperture plate is present. Thescatter image and its corresponding partial scatter-free image can beacquired under approximately the same conditions except for the presenceof the aperture plate. The method can further include receiving, by ananalyzer including one or more processors, the plurality of scatterimage data and corresponding partial-scatter free image data. The methodcan additionally include receiving, by the analyzer, a trained scattercorrection model. The method can further include, by the analyzer,updating, the trained scatter correction model based upon the receivedplurality of scatter image data and corresponding partial-scatter freeimage data, to yield an updated trained scatter correction model,correcting at least one of the plurality of scatter images based uponthe updated trained scatter correction model; and outputting at leastone corrected scatter image.

In an embodiment, the trained scatter correction model can be a trainedneural network model.

In another embodiment, updating the trained scatter correction model caninclude, for each pair of corresponding scatter image and partialscatter-free images, performing an interpolation between the output ofthe trained neural network model for the scatter image and the output ofthe trained neural network model for the partial scatter-free image, andgenerating the updated trained scatter correction model based upon theinterpolation.

In another embodiment, the trained scatter correction model can includea previously determined deconvolution point spread function (PSF)estimate.

In another embodiment, updating the trained scatter correction model caninclude locally parametrizing the deconvolution PSF estimate usingmeasurement points of respective pairs of corresponding scatter imageand partial scatter-free images, and updating the deconvolution PSFestimate based upon the local parametrization.

In another embodiment, an imaging system is provided. The imaging systemcan include a radiation source, a radiation detector, and an analyzer.The radiation source can be configured to emit radiation directedtowards an object. The radiation detector can be configured to detectthe emitted radiation transmitted through an imaging volume of theobject. The analyzer can include one or more processors. The analyzercan be further configured to receive data representing a plurality ofscatter images of an object based upon detection of radiation by theradiation source that is transmitted through an imaging volume of theobject. The analyzer can also be configured to receive data representinga partial scatter-free image corresponding to each scatter image. Eachpartial scatter-free image can be based upon detection of radiation thatis transmitted through the imaging volume of the object when theaperture plate is present. The scatter image and its correspondingpartial scatter-free image can be acquired under approximately the sameconditions except for the presence of the aperture plate. The analyzercan further be configured to receive a trained scatter correction modeland update the trained scatter correction model based upon the receivedplurality of scatter image data and corresponding partial-scatter freeimage data, to yield an updated trained scatter correction model. Theanalyzer can additionally be configured to correct at least one of theplurality of scatter images based upon the updated trained scattercorrection model, and output at least one corrected scatter image.

In another embodiment, the trained scatter correction model can be atrained neural network model.

In another embodiment, updating the trained scatter correction model caninclude, by the analyzer for each pair of corresponding scatter imageand partial scatter-free images, performing an interpolation between theoutput of the trained neural network model for the scatter image and theoutput of the trained neural network model for the partial scatter-freeimage, and generating the updated trained scatter correction model basedupon the interpolation.

In another embodiment, the trained scatter correction model can includea previously determined deconvolution point spread function (PSF)estimate.

In another embodiment, updating the trained scatter correction model caninclude locally parametrizing the deconvolution PSF estimate usingmeasurement points of respective pairs of corresponding scatter imageand partial scatter-free images, and updating the deconvolution PSFestimate based upon the local parametrization.

In another embodiment, a method for scatter correction of an image of anobject is provided. The method can include acquiring, by a radiationdetector of an imaging system, data representing a plurality of scatterimages of an object based upon detection of radiation that istransmitted through an imaging volume of the object. The method canfurther include placing an aperture plate between the object and theradiation detector. The aperture plate can include a plurality ofapertures configured to inhibit scattered radiation from detection bythe radiation detector. The method can additionally include acquiring,by the radiation detector, data representing a single partialscatter-free image. The single partial scatter-free image can be basedupon detection of radiation that is transmitted through the imagingvolume of the object when the aperture plate is present. The method canadditionally include receiving, by an analyzer including one or moreprocessors, the plurality of scatter image data and the singlepartial-scatter free image data. The method can also include receiving,by the analyzer, a trained scatter correction model. The method canfurther include updating, by the analyzer, the trained scattercorrection model based upon the received plurality of scatter image dataand the single partial-scatter free image data, to yield an updatedtrained scatter correction model. The method can additionally includecorrecting, by the analyzer, at least one of the plurality of scatterimages based upon the updated trained scatter correction model andoutputting, by the analyzer, at least one corrected scatter image.

In another embodiment, the trained scatter correction model can be atrained neural network model.

In another embodiment, updating the trained scatter correction model caninclude, for each image pair including a scatter image of the pluralityof scatter images and the single partial scatter-free image, performingan interpolation between the output of the trained neural network modelfor the scatter image and the output of the trained neural network modelfor the single partial scatter-free image, and generating the updatedtrained scatter correction model based upon the interpolation.

In another embodiment, the trained scatter correction model can includea previously determined deconvolution point spread function (PSF)estimate.

In another embodiment, updating the trained scatter correction model caninclude locally parametrizing the deconvolution PSF estimate usingmeasurement points of respective image pairs including a scatter imageof the plurality of scatter images and the single partial scatter-freeimage, and updating the deconvolution PSF estimate based upon the localparametrization.

In another embodiment, an imaging system is provided and can include aradiation source, a radiation detector, and an analyzer. The radiationsource can be configured to emit radiation directed towards an object.The radiation detector can be configured to detect the emitted radiationtransmitted through an imaging volume of the object. The analyzer caninclude one or more processors. The analyzer can be also configured toreceive data representing a plurality of scatter images of an objectbased upon detection of radiation by the radiation source that istransmitted through an imaging volume of the object. The analyzer can befurther configured to receive data representing a single partialscatter-free image. The single partial scatter-free image can be basedupon detection of radiation that is transmitted through the imagingvolume of the object when the aperture plate is present. The analyzercan additionally be configured to receive a trained scatter correctionmodel, update the trained scatter correction model based upon thereceived plurality of scatter image data and the single partial-scatterfree image data, to yield an updated trained scatter correction model,correct at least one of the plurality of scatter images based upon theupdated trained scatter correction model, and output at least onecorrected scatter image.

In another embodiment, the trained scatter correction model can be atrained neural network model.

In another embodiment, updating the trained scatter correction model caninclude, for each image pair including a scatter image of the pluralityof scatter images and the single partial scatter-free image, performingan interpolation between the output of the trained neural network modelfor the scatter image and the output of the trained neural network modelfor the single partial scatter-free image, and generating the updatedtrained scatter correction model based upon the interpolation.

In another embodiment, the trained scatter correction model can includea previously determined deconvolution point spread function (PSF)estimate.

In another embodiment, updating the trained scatter correction model caninclude locally parametrizing the deconvolution PSF estimate usingmeasurement points of respective image pairs including a scatter imageof the plurality of scatter images and the single partial scatter-freeimage, and updating the deconvolution PSF estimate based upon the localparametrization.

DESCRIPTION OF DRAWINGS

These and other features will be more readily understood from thefollowing detailed description taken in conjunction with theaccompanying drawings, in which:

FIG. 1A is a schematic diagram illustrating a top view of one exemplaryembodiment of an CT imaging system;

FIG. 1B is a schematic diagram illustrating a side view of the CTimaging system of FIG. 1A;

FIG. 2A is a schematic diagram illustrating positions of apertures of anaperture plate when the aperture plate is located at a first position;

FIG. 2B is a schematic diagram illustrating positions of the aperturesof the aperture plate when the aperture plate is located at the firstposition and a second position that is vertically translated withrespect to the first position;

FIG. 2C is a schematic diagram illustrating positions of the aperturesof the aperture plate when the aperture plate is located at the firstposition and a third position that is horizontally translated from thefirst position;

FIG. 2D is a schematic diagram illustrating positions of the aperturesof the aperture plate when the aperture plate is located at the firstposition, the second position, and the third position;

FIG. 2E is a schematic diagram illustrating positions of the aperturesof the aperture plate when the aperture plate is located at a pluralityof positions that cover substantially all of a desired field of view;

FIG. 3A is a CT image that is scatter corrected using a single positionof the aperture plate;

FIG. 3B is a CT image that is scatter corrected using four positions ofthe aperture plate;

FIG. 4 is a schematic block diagram illustrating computationaltechniques employing the scatter images and scatter-free images asinputs for development of scatter correction algorithms ordeconvolution;

FIG. 5 is a flow diagram illustrating one exemplary embodiment of amethod for scatter correction of CT images;

FIG. 6 is a schematic diagram illustrating the high number ofmeasurement points for adjustment, which is given with aperture plate;

FIG. 7 is a flow diagram illustrating one exemplary embodiment of amethod for scatter correction in which a previously trained neuralnetwork or previously determined deconvolution PSF is adjusted basedupon corresponding pairs of images of a scatter image set and a partialscatter-free image set;

FIG. 8 is a flow diagram illustrating one exemplary embodiment ofanother method for scatter correction in which a previously trainedneural network or previously determined deconvolution PSF is adjustedbased upon corresponding pairs of images of a scatter image set and asingle partial scatter-free image;

FIG. 9 is a flow diagram illustrating one exemplary embodiment of afurther method for scatter correction in which a previously trainedneural network or previously determined deconvolution PSF is adjustedbased upon an undefined number of scatter image sets for differentobject types where a single partial-scatter free image or partialscatter-free image set is employed;

FIG. 10A is a schematic diagram illustrating a top view of one exemplaryembodiment of an CT imaging system; and

FIG. 10B is a schematic diagram illustrating a side view of the CTimaging system of FIG. 10A.

It is noted that the drawings are not necessarily to scale. The drawingsare intended to depict only typical aspects of the subject matterdisclosed herein, and therefore should not be considered as limiting thescope of the disclosure.

DETAILED DESCRIPTION

When performing x-ray inspection, x-rays can be passed through a targetobject and detected by a detector to generate images. Some x-rays can bescattered from their initial trajectory, which introduces artifacts thatreduce contrast in the images. Techniques for scatter correction havebeen developed but each have problems. In one example, simulations havebeen developed to model scatter. However, such simulations can be basedupon limited to no experimental data (pure simulation) and/or can relyheavily on interpolation (limited experimental data supplemented byinterpolation). Furthermore, not all aspects of scatter can be simulatedor interpolated with sufficient exactness. The missing exactness canresult in introduction of artifacts in scatter-corrected images. Thus,scatter estimates resulting from these simulations can deviatesignificantly from actual scatter. Accordingly, improved systems andmethods for scatter correction for x-ray inspection (e.g., computedtomography) are provided. Scatter-free images and scattered images canbe used as inputs for computational techniques, such as deep learning(e.g., neural networks) or deconvolution models. The scatter-free imagescan be generated from multiple partial-scatter free images acquiredusing an aperture plate containing apertures. Each partial scatter-freeimage is acquired with the aperture plate at a different position andblocks a portion of the scattered x-rays. Sufficient partialscatter-free images can be acquired so that the combination of aperturepositions of the aperture plate at the different positions cover anentire scatter image. The combination of partial scatter-free imagesgives the scatter-free image. Scatter-free images generated in thismanner are measured in small collimated areas, without interpolation,resulting in high precision for scatter estimation.

Embodiments of the present disclosure are generally directed to scattercorrection for computed tomography (CT) imaging that achieve improvedimage quality. Such imaging techniques may be useful in a variety ofimaging contexts, such as medical imaging, industrial metrology andinspection, security screening, baggage or package inspection, and soforth. Moreover, such imaging techniques may be employed in a variety ofimaging systems, such as CT systems, tomosynthesis systems, X-rayimaging systems, and so forth. Though the present discussion providesexamples in an industrial inspection context with respect to CT systemsresulting in improved measurement and inspection accuracy, one ofordinary skill in the art will readily apprehend that the application ofthese techniques in other contexts and in other systems is well withinthe scope of the present techniques.

FIGS. 1A-1B illustrate an imaging system 200 configured to produce ahigh resolution images. The imaging system 200 can be a volumetriccomputed tomography (VCT) system designed both to acquire image data andto process the image data for display and analysis. As shown, theimaging system 200 can include a radiation source 202, such as an X-raysource 202. A collimator 205 can be positioned adjacent to the radiationsource 202 for collimating the radiation 204 emitted by the radiationsource 202 and regulating the size and shape of the emitted radiation204 emitted by the radiation source 202.

The stream of radiation 204 can be projected toward a detector array 206placed on the opposite side of the radiation source 202, relative to anobject 208 that is to be imaged. The object 208 can be any objectsuitable for x-ray inspection (e.g., turbine blades). The stream ofradiation 204 can pass into an imaging volume in which the object 208 tobe imaged. A portion of the radiation 204 passes through or around theobject 208 and impacts the detector array 206. The detector array 206can be generally formed as a two-dimensional array of detectionelements. Data collected by the detector array 206 can be output to ananalyzer 207 including one or more processors.

The object 208, radiation source 202, and detector array 206 can bedisplaced relative to each other, allowing projection data to beacquired at various views relative to the object 208 if desired. As anexample, the object 208 can be positioned on a table, such as aturntable, so that the object 208 may be rotated about a rotation axis210. In certain embodiments, data collected from the detector array 206can undergo pre-processing (e.g., by the analyzer 207) to condition thedata to represent the line integrals of the attenuation coefficients ofthe scanned object 208. The processed data or projections can then bereconstructed (e.g., by the analyzer 207 or another computing device toformulate a volumetric image of the scanned area, as discussed ingreater in U.S. Pat. No. 9,804,106, the entirety of which isincorporated by reference.

The imaging system 200 can employ a variety of scatter mitigation and/orcorrection techniques for improving the image quality and resolution.For example, a scatter rejecting aperture plate 212 for rejecting thescatter radiation resulting from the object 208, as well as thoseresulting from the background, can be employed. In order to furtherimprove the resolution and image quality, the aperture plate 212 can bemovable between a plurality of positions, discussed in greater detailbelow. By moving the aperture plate 212 between the plurality ofpositions, smaller structures on the object 208 can be recognized andartifacts can be better avoided.

As discussed in greater detail in U.S. Pat. No. 9,804,106, the apertureplate 212 can include a plurality of sub-centimeter sized apertures 48,such as circular apertures, drilled in a plate. The apertures 48 can bepositioned on a two-dimensional grid. Embodiments of the apertures 48have any geometric shape, such as a circular shape, rectangular shape,or hexagonal shape, among others. In certain embodiments, the circularapertures 48 may be about 1-2 millimeters in diameter spaced apart atabout 5 millimeters from each other (center-to-center).

As discussed above, the aperture plate 212 can be movable between aplurality of positions in order to increase the resolution and qualityof the generated image. As shown in FIG. 2A, the aperture plate 212 caninitially be placed in a first position 211. After a first grid image isgathered, the aperture plate 212 can be repositioned to a secondaryposition 213, 214 and a second grid image gathered. In an embodiment,the aperture plate 212 can be moved uni-directionally. For example, theaperture plate 212 can be moved vertically from the first position 211to the second position 213, as illustrated in FIG. 2B, and a secondimage gathered or the aperture plate 212 can be moved horizontally fromthe first position 211 to the third position 214, as illustrated in FIG.2C, and the second image gathered. In another embodiment, the apertureplate 212 can be moved bi-directionally. For example, the aperture plate212 can be moved both vertically and horizontally, as illustrated inFIG. 2D. In this embodiment, the aperture plate 212 can be placed in afirst position 211 and a first image gathered, moved to a secondposition 213 and a second image gathered, moved to a third position 214and a third image gathered, and moved to a fourth position 215 and afourth image gathered. In another embodiment, the aperture plate 212 canbe rotated relative to the object 208. An image can be gathered at eachposition 211, 213, 214, 215 of the aperture plate 212. As shown in FIG.2E, the process of moving the aperture plate 212 an acquiring an imagecan be repeated until the aperture positions cover an entire desiredarea.

In another embodiment, resolution of the image can also be increased bymoving the object 208 in front of the grid of the aperture plate 212.Similar to repositioning the aperture plate 212, discussed above, inthis embodiment the sample can be moved uni-directionally,bi-directionally, or rotated, for example. By repositioning theapertures 48 of the aperture plate 212 relative to the object 208, theresolution of the image can be increased. The aperture plate 212 and/orobject 208 can be repositioned manually or automatically.

The resolution of the image can be determined by the number of positionsat which the aperture plate 212 and/or object 208 can be placed. As thenumber of positions increases, the resolution of the image alsoincreases. For example, using bi-directional movement of the apertureplate 212, positioning the aperture plate 212 in four positionsincreases the image resolution by a factor of two (2). In anotherexample, positioning the aperture plate 212 in sixteen positionsincreases the image resolution by a factor of four (4). This improvementin image resolution by repositioning the aperture plate 212 isillustrated by FIGS. 3A-3B.

FIG. 3A illustrates an image 216 of the object 208 generated in whichthe aperture plate 212 was placed in a single position. FIG. 3Billustrates an image 219 of the object 208 in which the aperture plate212 was placed in four positions during gathering of the data. Asillustrated by the first 217 and second 218 location indicated in thesefigures, the additional positions of the aperture plate 212 results inan image in FIG. 3B in which additional details are visible at each ofthe first location 217 and the second location 218 as compared to FIG.3A.

The scatter free image can be used in combination with computationalapproaches for scatter correction. This combination can create betterresults and less scanning effort for scatter correction in x-raytomography. Examples of computational approaches can include deeplearning (e.g., neural networks) or deconvolutional approaches.

As illustrated in FIG. 4 , a set of scatter images 402 and a set ofscatter-free images can be input into a model 406 (e.g., a neuralnetwork or scatter edge spread function (ESF)). In the case of a neuralnetwork, one or more algorithms can be received or generated for scattercorrection and applied to the scatter image set 402. In the case ofdeconvolution, with scatter ESF, a point spread function (PSF) fordeconvolution can be received or generated and applied to the scatterimage set 402. In either case, deviations between the scatter correctedimage set and the scatter-free image set 404 are determined and used asfeedback 410 for revision of the algorithms. This process repeatsitself, updating the algorithms or parameters each iteration untildeviations between the scatter corrected image set and the scatter-freeimage set 404 are less than a predetermined deviation. Subsequently, thedetermined algorithm or PSF is output.

FIG. 5 is a flow diagram illustrating one exemplary embodiment of amethod 500 for scatter correction of an image of an object, such as theobject 208, by employing an advanced scatter measurement and correctiontechnique on the imaging system 200 is depicted. As shown, the method500 includes operations 502-512. It can be understood that this methodis exemplary only and that selected operations can be altered, added,removed, and/or rearranged as necessary.

In operation 502, at least one scatter image of the object 208 can beacquired. In certain embodiments, a plurality of scatter images (e.g., ascatter image set) can be acquired.

In operation 504, the aperture plate 212 is placed between the object208 and the detector 206 at a first position. As discussed above, theaperture plate 212 can include the plurality of apertures 211 and can beconfigured to inhibit scatter radiation (e.g., x-rays scattered from theobject 208 and/or background) from detection by the detector array 206.At least one first partial scatter-free image (e.g., a single partialscatter free image or a partial scatter free image set including aplurality of partial scatter free images) can be acquired when theaperture plate 212 is in the first position.

In operation 506, the aperture plate 212 can be moved to one or moreother positions (e.g., one or more second positions), different from thefirst position. As an example, movement of the aperture plate 212 caninclude translation alone, rotation alone, or combinations oftranslation and rotation. Translation can include movement in at leastone direction (e.g., a horizontal direction, a vertical direction, orcombinations thereof). The apertures can overlap or be spaced apart by apredetermined distance between the first and second positions. A secondpartial scatter-free image or partial scatter-free image set can beacquired when the aperture plate 212 is positioned at selected ones ofthe second positions (e.g., at least a portion and up to all of thesecond positions). Operation 506 can be repeated to generate as manypartial scatter-free images/image sets as are necessary such that theapertures cover approximately the entire scatter image.

In operation 510, the acquired partial scatter-free images can bereceived by an analyzer and combined to generate a scatter freeimage/image set. In certain embodiments, at least a portion of thepartial scatter-free images are employed.

In operation 512, the scatter image/image set and the scatter-freeimage/image set are employed for training of deep learning algorithms orPSF estimation of deconvolution algorithms.

It can be appreciated that changes in an x-ray inspection system canchange the images acquired by the x-ray inspection system. Such changescan include, but are not limited to, the x-ray detector, the x-raysource, the target being inspected, and the environment. X-ray detectorchanges can include one or more of replacement of one x-ray detectorwith another and changes in detection capability due to aging. X-raysource changes can include any change in the x-ray spectra emitted bythe x-ray source. Such changes can occur due to replacement ofcomponents of the x-ray source (e.g., filters, tubes, etc.) orreplacement of the entire x-ray source with another x-ray source.Changes in the environment can include any changes in x-ray scatteringbehavior due to the environment surrounding the x-ray source.

As a result of these changes, neural network algorithms that have beentrained prior to such changes can introduce errors in outputscatter-corrected images. Similarly, deconvolution PSF estimatesdetermined prior to such changes can introduce errors in outputscatter-corrected images.

Accordingly, to address the effects of changes in the x-ray inspectionsystem, previously determined neural network algorithms can be retrainedor the deconvolution PSF estimates can be updated. That is, the neuralnetwork training or deconvolution PSF estimates do not need to becompletely regenerated. Beneficially retraining the previouslydetermined neural network algorithm or updating the previouslydetermined PSF estimates can require significantly less training dataand time than generation from scratch.

As discussed in greater detail below, retraining a neural networkalgorithm or updating deconvolution PSF estimates can be performed in avariety of ways. A single image or a whole image set can be employed.The adjustment can valid for one data set and on sample type or for manydata sets also with different sample types. The choice of training datadepends on the neural network or evaluated PSF, if they was created forgeneral correction or for more specialized cases.

FIG. 6 is a schematic illustration of the aperture plate 212illustrating the high number of different possible measurement pointsthat can be used for acquiring partial scatter-free images forretraining a neural network or adjusting PSF estimates for adeconvolution algorithm.

FIG. 7 is a flow diagram of one exemplary embodiment of a method 700 forretraining a neural network or adjusting PSF estimates for adeconvolution algorithm. As shown, the method 700 includes operations702-712. It can be understood that this method is exemplary only andthat selected operations can be altered, added, removed, and/orrearranged as necessary.

In operation 702, a plurality of scatter images (e.g., a set of scatterimages) of the object 208 can be acquired.

In operation 704, the aperture plate 212 is placed between the object208 and the detector 206 and a partial scatter-free image correspondingto each of the acquired scatter images can be acquired by the radiationdetector 206. That is, a partial scatter-free image corresponding to ascatter image can be acquired under the same conditions, orapproximately the same conditions (e.g., within equipment tolerances) asthat scatter image, except that the difference being the presence of theaperture plate 212 during acquisition of the partial scatter-free image.

The acquired scatter image data and partial-scatter free image data canbe further received by the analyzer 207. In certain embodiments, theanalyzer 207 can receive the acquired scatter image data andpartial-scatter free image data directly from the radiation detector206. In other embodiment, the analyzer 207 can receive the acquiredscatter image data and partial-scatter free image data from anothersource (e.g., a memory device).

In operation 706, the scatter image set and partial scatter-free imageset can be employed by the analyzer 207 to retrain (adjust or update) apreviously trained scatter correction model (e.g., a previously trainedscatter correction algorithm of a neural network or previouslydetermined deconvolution PSF estimates). For scatter correction modelsemploying neural networks, the retraining can include performing aninterpolation between the output of the neural network as previouslytrained for a given scatter image and the corresponding acquired partialscatter-free image. Accordingly, there can be an interpolationdetermined by the analyzer 207 for each corresponding scatter image andpartial scatter-free image pair. The respective interpolations can beemployed by the neural network to generate the adjusted scattercorrection algorithm. For scatter correction models employingdeconvolution approaches, the deconvolution function can be parametrizedlocally with every measurement point (e.g., each corresponding scatterimage and partial scatter-free image pair), rather than generally.

In operation 710, the updated scatter correction model (e.g., neuralnetwork algorithm or deconvolution PSF estimates) can be used by theanalyzer 207 to correct at least one scatter image of the plurality ofscatter images.

In operation 712, at least one of the corrected scatter images can beoutput by the analyzer 207. For example, the at least one correctedscatter image can be output to a memory device for storage and/or adisplay device for viewing.

FIG. 8 is a flow diagram of one exemplary embodiment of another method800 that can be performed by the analyzer 207 for retraining (adjustingor updating) a neural network or PSF estimates for a deconvolutionalgorithm. As shown, the method 800 includes operations 802-812. It canbe understood that this method is exemplary only and that selectedoperations can be altered, added, removed, and/or rearranged asnecessary.

In operation 802, a plurality of scatter images (e.g., a set of scatterimages) of the object 208 can be acquired by the radiation detector 206.

In operation 804, the aperture plate 212 is placed between the object208 and the detector 206 and a single partial scatter-free image can beacquired by the radiation detector 206.

The acquired scatter image data and partial-scatter free image data canbe further received by the analyzer 207. In certain embodiments, theanalyzer 207 can receive the acquired scatter image data andpartial-scatter free image data directly from the radiation detector206. In other embodiment, the analyzer 207 can receive the acquiredscatter image data and partial-scatter free image data from anothersource (e.g., a memory device).

In operation 806, the plurality of scatter image data and the singlepartial scatter-free image data can be employed to retrain (e.g., adjustor update) a previously trained scatter correction model (e.g., apreviously trained scatter correction algorithm of a neural network orpreviously determined deconvolution PSF estimates). For scattercorrection models employing neural networks, the retraining can includeperforming an interpolation between the output of the neural network aspreviously trained for a given scatter image and the single acquiredpartial scatter-free image. Accordingly, there can be an interpolationdetermined by the analyzer 207 for each scatter image and single partialscatter-free image pair. The respective interpolations can be employedby the neural network to generate the adjusted scatter correctionalgorithm. For scatter correction models employing deconvolutionapproaches, the deconvolution function can be parametrized locally withevery measurement point (e.g., each scatter image and single partialscatter-free image pair), rather than generally.

In operation 810, the updated scatter correction model (e.g., neuralnetwork algorithm or deconvolution PSF estimates) can be used by theanalyzer 207 to correct at least one scatter image of the plurality ofscatter images.

In operation 812, at least one of the corrected scatter images can beoutput by the analyzer 207. For example, the at least one correctedscatter image can be output to a memory device for storage and/or adisplay device for viewing.

Under circumstances where a single partial scatter-free image isacquired for adjustment, the x-ray inspection system can optionally omitthe capability of moving the aperture plate 212, as illustrated in FIGS.10A-10B.

The choice of whether to employ the method 700 or method 800 foradjusting the neural network or deconvolution ESF can depend upon theuse case and needed accuracy of scatter correction. As an example, undercircumstances where each inspected object 208 is the same, the singlepartial-free image approach of method 800 can be sufficient. Thismeasurement can be performed periodically to adjust the neural networkor deconvolution ESF to account for aging of components.

FIG. 9 is a flow diagram of one exemplary embodiment of a further method900 for retraining (adjusting) a neural network or PSF estimates for adeconvolution algorithm. As shown, the method 900 includes operations902-912. It can be understood that this method is exemplary only andthat selected operations can be altered, added, removed, and/orrearranged as necessary.

In operation 902, a scatter image or a set of scatter images of theobject 208 are acquired.

In operation 904, the aperture plate 212 is placed between the object208 and the detector 206 and a single partial scatter-free image or apartial scatter-free image set is acquired. As noted above, whenacquiring a set of partial scatter-free images, each image of thescatter free image set can correspond to respective images of thescatter image set.

In operation 906, the scatter image set and the single partialscatter-free image or scatter-free image set can be employed to retrain(adjust) the previously trained neural network or previously determineddeconvolution PSF estimates. Adjustment performed using the partialscatter-free image set can be performed as discussed above in operation706. Adjustment performed using the single partial scatter-free imagecan be performed as discussed above in operation 806.

In operation 910, the adjusted neural network algorithm or deconvolutionPSF estimates can be used to correct the scatter image set.

In operation 912, a scatter image or scatter image set of the same typeof object 208 or different type of object 208 can be acquired. Scattercorrection can be performed using the adjusted neural network algorithmor deconvolution PSF estimates. Operation 912 can be repeated so long asthe correction quality is sufficient for the desired result withoutreadjustment.

Exemplary technical effects of the methods, systems, and devicesdescribed herein include, by way of non-limiting example improvedscatter correction for x-ray images. A scatter free image can begenerated from a plurality of partial scatter-free images acquired usingan aperture plate positioned at different positions. The scatter-freeimage can used in combination with computational approaches (e.g., deeplearning, deconvolution, etc.) for scatter correction. This combinationcan create better results and less scanning effort for scattercorrection in x-ray tomography.

Certain exemplary embodiments have been described to provide an overallunderstanding of the principles of the structure, function, manufacture,and use of the systems, devices, and methods disclosed herein. One ormore examples of these embodiments have been illustrated in theaccompanying drawings. Those skilled in the art will understand that thesystems, devices, and methods specifically described herein andillustrated in the accompanying drawings are non-limiting exemplaryembodiments and that the scope of the present invention is definedsolely by the claims. The features illustrated or described inconnection with one exemplary embodiment may be combined with thefeatures of other embodiments. Such modifications and variations areintended to be included within the scope of the present invention.Further, in the present disclosure, like-named components of theembodiments generally have similar features, and thus within aparticular embodiment each feature of each like-named component is notnecessarily fully elaborated upon.

The subject matter described herein can be implemented in analogelectronic circuitry, digital electronic circuitry, and/or in computersoftware, firmware, or hardware, including the structural meansdisclosed in this specification and structural equivalents thereof, orin combinations of them. The subject matter described herein can beimplemented as one or more computer program products, such as one ormore computer programs tangibly embodied in an information carrier(e.g., in a machine-readable storage device), or embodied in apropagated signal, for execution by, or to control the operation of,data processing apparatus (e.g., a programmable processor, a computer,or multiple computers). A computer program (also known as a program,software, software application, or code) can be written in any form ofprogramming language, including compiled or interpreted languages, andit can be deployed in any form, including as a stand-alone program or asa module, component, subroutine, or other unit suitable for use in acomputing environment. A computer program does not necessarilycorrespond to a file. A program can be stored in a portion of a filethat holds other programs or data, in a single file dedicated to theprogram in question, or in multiple coordinated files (e.g., files thatstore one or more modules, sub-programs, or portions of code). Acomputer program can be deployed to be executed on one computer or onmultiple computers at one site or distributed across multiple sites andinterconnected by a communication network.

The processes and logic flows described in this specification, includingthe method steps of the subject matter described herein, can beperformed by one or more programmable processors executing one or morecomputer programs to perform functions of the subject matter describedherein by operating on input data and generating output. The processesand logic flows can also be performed by, and apparatus of the subjectmatter described herein can be implemented as, special purpose logiccircuitry, e.g., an FPGA (field programmable gate array) or an ASIC(application-specific integrated circuit).

Processors suitable for the execution of a computer program include, byway of example, both general and special purpose microprocessors, andany one or more processor of any kind of digital computer. Generally, aprocessor will receive instructions and data from a read-only memory ora random access memory or both. The essential elements of a computer area processor for executing instructions and one or more memory devicesfor storing instructions and data. Generally, a computer will alsoinclude, or be operatively coupled to receive data from or transfer datato, or both, one or more mass storage devices for storing data, e.g.,magnetic, magneto-optical disks, or optical disks. Information carrierssuitable for embodying computer program instructions and data includeall forms of non-volatile memory, including by way of examplesemiconductor memory devices, (e.g., EPROM, EEPROM, and flash memorydevices); magnetic disks, (e.g., internal hard disks or removabledisks); magneto-optical disks; and optical disks (e.g., CD and DVDdisks). The processor and the memory can be supplemented by, orincorporated in, special purpose logic circuitry.

To provide for interaction with a user, the subject matter describedherein can be implemented on a computer having a display device, e.g., aCRT (cathode ray tube) or LCD (liquid crystal display) monitor, fordisplaying information to the user and a keyboard and a pointing device,(e.g., a mouse or a trackball), by which the user can provide input tothe computer. Other kinds of devices can be used to provide forinteraction with a user as well. For example, feedback provided to theuser can be any form of sensory feedback, (e.g., visual feedback,auditory feedback, or tactile feedback), and input from the user can bereceived in any form, including acoustic, speech, or tactile input.

The techniques described herein can be implemented using one or moremodules. As used herein, the term “module” refers to computing software,firmware, hardware, and/or various combinations thereof. At a minimum,however, modules are not to be interpreted as software that is notimplemented on hardware, firmware, or recorded on a non-transitoryprocessor readable recordable storage medium (i.e., modules are notsoftware per se). Indeed “module” is to be interpreted to always includeat least some physical, non-transitory hardware such as a part of aprocessor or computer. Two different modules can share the same physicalhardware (e.g., two different modules can use the same processor andnetwork interface). The modules described herein can be combined,integrated, separated, and/or duplicated to support variousapplications. Also, a function described herein as being performed at aparticular module can be performed at one or more other modules and/orby one or more other devices instead of or in addition to the functionperformed at the particular module. Further, the modules can beimplemented across multiple devices and/or other components local orremote to one another. Additionally, the modules can be moved from onedevice and added to another device, and/or can be included in bothdevices.

The subject matter described herein can be implemented in a computingsystem that includes a back-end component (e.g., a data server), amiddleware component (e.g., an application server), or a front-endcomponent (e.g., a client computer having a graphical user interface ora web browser through which a user can interact with an implementationof the subject matter described herein), or any combination of suchback-end, middleware, and front-end components. The components of thesystem can be interconnected by any form or medium of digital datacommunication, e.g., a communication network. Examples of communicationnetworks include a local area network (“LAN”) and a wide area network(“WAN”), e.g., the Internet.

Approximating language, as used herein throughout the specification andclaims, may be applied to modify any quantitative representation thatcould permissibly vary without resulting in a change in the basicfunction to which it is related. Accordingly, a value modified by a termor terms, such as “about,” “approximately,” and “substantially,” are notto be limited to the precise value specified. In at least someinstances, the approximating language may correspond to the precision ofan instrument for measuring the value. Here and throughout thespecification and claims, range limitations may be combined and/orinterchanged, such ranges are identified and include all the sub-rangescontained therein unless context or language indicates otherwise.

One skilled in the art will appreciate further features and advantagesof the invention based on the above-described embodiments. Accordingly,the present application is not to be limited by what has beenparticularly shown and described, except as indicated by the appendedclaims. All publications and references cited herein are expresslyincorporated by reference in their entirety.

The invention claimed is:
 1. A method for scatter correction of an imageof an object, comprising: acquiring, by a radiation detector of animaging system, data representing at least one scatter image of anobject based upon detection of radiation that is transmitted through animaging volume of the object; placing an aperture plate between theobject and the radiation detector at a first position, the apertureplate comprising a plurality of apertures configured to inhibitscattered radiation from detection by the radiation detector; acquiring,by the radiation detector, data representing at least one first partialscatter-free image based upon detection of radiation that is transmittedthrough the imaging volume of the object when the aperture plate is inthe first position; moving the aperture plate to one or more secondpositions, different from the first position, wherein the apertures ofthe first position and one or more second positions cover the area ofthe object captured within the at least one scattered image; acquiring,by the radiation detector, data representing at least one second partialscatter-free image based upon detection of radiation that is transmittedthrough the imaging volume of the object when the aperture plate is inthe one or more second positions; receiving, by an analyzer comprisingone or more processors, the at least one first and second partialscatter-free image data; generating, by the analyzer, at least onescatter-free image based upon a combination of at least a portion of theat least one first partial scatter-free image data and at least aportion of the at least one second partial scatter-free image data;updating, by the analyzer, a scatter correction model using at least aportion of the at least one scatter image and the at least onescatter-free image, wherein the scatter correction model is a neuralnetwork model including a scatter correction algorithm and updating thescatter correction model further comprises applying the scattercorrection algorithm to at least a portion of the at least one scatterimage to generate a scatter-corrected image, determining a deviationbetween the generated scatter-corrected image and the at least onescatter-free image, when the deviation is greater than a predetermineddeviation, updating the scatter correction algorithm to reduce thedeviation, and when the deviation is less than or equal to thepredetermined deviation, outputting the updated scatter correction modelincluding the updated scatter correction algorithm; and outputting, bythe analyzer, the updated scatter correction model.
 2. The method ofclaim 1, wherein the scatter correction model comprises a deconvolutionincluding a scatter edge spread function (ESF), the scatter edge spreadfunction further including a point spread function (PSF) configured tocorrect scatter within a scatter image, and wherein the method furthercomprises, by the analyzer, updating the scatter correction model by:applying the PSF to at least a portion of the at least one scatter imageto generate a scatter-corrected image; determining a deviation betweenthe scatter-corrected image and the at least one scatter-free image;when the deviation is above a predetermined deviation, updatingparameters of the PSF to reduce the deviation and repeating saidapplying and determining operations; and when the deviation is below thepredetermined deviation, outputting the updated scatter correction modelincluding the updated PSF parameters.
 3. The method of claim 1, whereinthe detected radiation is collimated.
 4. The method of claim 1, whereinthe at least one scatter free image is not generated by interpolation ofthe at least one first partial scatter-free image data or the at leastone second partial scatter-free image data.
 5. The method of claim 1,wherein moving the aperture plate comprises at least one of aunidirectional translation, a bidirectional translation, or a rotation.6. The method of claim 1, wherein the at least one scatter image is ascatter image set comprising a plurality of images.
 7. The method ofclaim 1, wherein the apertures are arranged in a two-dimensional grid.8. The method of claim 1, wherein the apertures in the first positionand at the least one second position overlap one another.
 9. The methodof claim 1, wherein the apertures in the first position and the at leastone second position are spaced apart by a predetermined distance fromone another.
 10. An imaging system, comprising: a radiation sourceconfigured to emit radiation directed towards an object; a radiationdetector configured to detect the emitted radiation transmitted throughan imaging volume of the object; a moveable aperture plate positionedbetween the object and the radiation detector and further comprising aplurality of apertures configured to inhibit scattered radiation fromdetection by the radiation detector; and an analyzer including one ormore processors and configured to: receive data representing at leastone scatter image of the object based upon detection of radiationtransmitted through an imaging volume of the object; receive datarepresenting at least one first partial scatter-free image of the objectbased upon detection of radiation that is transmitted through theimaging volume of the object when the aperture plate is in a firstposition; receive data representing at least one second partialscatter-free image based upon detection of radiation that is transmittedthrough the imaging volume of the object when the aperture plate is inone or more second positions, different from the first position; whereinthe apertures in the first position and the one or more second positionscover the area of the object captured within the at least one scatteredimage; generate at least one scatter-free image based upon a combinationof at least a portion of the at least one first partial scatter-freeimage data and at least a portion of the at least one second partialscatter-free image data; train a scatter correction model using at leasta portion of the at least one scatter image and the at least onescatter-free image, wherein the scatter correction model is a neuralnetwork model including a scatter correction algorithm and training thescatter correction model further comprises applying the scattercorrection algorithm to at least a portion of the at least one scatterimage to generate a scatter-corrected image, determining a deviationbetween the generated scatter-corrected image and the at least onescatter-free image, when the deviation is greater than a predetermineddeviation, updating the scatter correction algorithm to reduce thedeviation, and when the deviation is less than or equal to thepredetermined deviation, outputting the updated scatter correction modelincluding the updated scatter correction algorithm; and output, by theanalyzer, the trained scatter correction model.
 11. The system of claim10, wherein the scatter correction model comprises a deconvolutionincluding a scatter edge spread function (ESF), the scatter edge spreadfunction further including a point spread function (PSF) configured tocorrect scatter within a scatter image, and wherein the analyzer isfurther configured to train the PSF by: applying the PSF to at least aportion of the at least one scatter image to generate ascatter-corrected image; determining a deviation between thescatter-corrected image and the at least one scatter-free image; andwhen the deviation is above a predetermined deviation, updating theparameters of the PSF to reduce the deviation and repeating saidapplying and determining operations; and when the deviation is below thepredetermined deviation, output the PSF parameters.
 12. The system ofclaim 10, further comprising a collimator configured to collimate theemitted radiation.
 13. The system of claim 10, wherein the analyzer isnot configured to generate the at least one scatter free image byinterpolation of the at least one first partial scatter-free image dataor the at least one second partial scatter-free image data.
 14. Thesystem of claim 10, wherein the first and at least one second positionsdiffer by at least one of a unidirectional translation, a bidirectionaltranslation, or a rotation.
 15. The system of claim 10, wherein the atleast one scatter image is a scatter image set comprising a plurality ofimages.
 16. The system of claim 10, wherein the apertures are arrangedin a two-dimensional grid.
 17. The system of claim 10, wherein theapertures in the first position of the aperture plate and at the leastone second position of the aperture plate overlap one another.
 18. Thesystem of claim 10, wherein the apertures in the first position of theaperture plate and the at least one second position of the apertureplate are spaced apart by a predetermined distance from one another.